Invention Grant
- Patent Title: Signal wave arrival angle measuring device
- Patent Title (中): 信号波到达角测量装置
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Application No.: US12422036Application Date: 2009-04-10
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Publication No.: US08130147B2Publication Date: 2012-03-06
- Inventor: Masashi Mitsumoto
- Applicant: Masashi Mitsumoto
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2008-266274 20081015
- Main IPC: G01S5/02
- IPC: G01S5/02 ; G01S13/00 ; H01Q3/00

Abstract:
A signal wave arrival angle measuring device includes: an observation data vector generation section generating an observation data vector necessary for an angle measurement of a signal wave from an electrical signal having been converted at a sensor group converting the signal wave of an observation target to the electrical signal; an ESPRIT angle measurement processing section calculating an arrival angle of the signal wave from the generated observation data vector; an arriving signal wave estimation section estimating information other than the arrival angle of the arriving signal wave from an angle measurement processing process data of the ESPRIT angle measurement processing at the ESPRIT angle measurement processing section; and a reliability determination section determining whether or not an angle measurement result of the calculated arrival angle is correct based on an estimation result of the arriving signal wave estimation section, and excluding an erroneous angle measurement result.
Public/Granted literature
- US20100090900A1 SIGNAL WAVE ARRIVAL ANGLE MEASURING DEVICE Public/Granted day:2010-04-15
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