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US08129800B2 Gate-all-around integrated circuit devices 有权
全能集成电路器件

Gate-all-around integrated circuit devices
Abstract:
Gate-all-around integrated circuit devices include first and second source/drain regions on an active area of an integrated circuit substrate. The first and second source/drain regions form p-n rectifying junctions with the active area. A channel region extends between the first and second source/drain regions. An insulated gate electrode surrounds the channel region.
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