Invention Grant
- Patent Title: On-chip calibration system and method for infrared sensor
- Patent Title (中): 红外传感器的片上校准系统和方法
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Application No.: US12380318Application Date: 2009-02-26
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Publication No.: US08129682B2Publication Date: 2012-03-06
- Inventor: Walter B. Meinel , Kalin V. Lazarov
- Applicant: Walter B. Meinel , Kalin V. Lazarov
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent John J. Patti; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: G01J5/02
- IPC: G01J5/02

Abstract:
A radiation sensor includes an integrated circuit radiation sensor chip (1A) including first (7) and second (8) thermopile junctions connected in series to form a thermopile (7,8) within a dielectric stack (3). The first thermopile junction (7) is insulated from a substrate (2) of the chip. A resistive heater (6) in the dielectric stack for heating the first thermopile junction is coupled to a calibration circuit (67) for calibrating responsivity of the thermopile (7,8). The calibration circuit causes a current flow in the heater and multiplies the current by a resulting voltage across the heater to determine power dissipation. A resulting thermoelectric voltage (Vout) of the thermopile (7,8) is divided by the power to provide the responsivity of the sensor.
Public/Granted literature
- US20100213374A1 On-chip calibration system and method for infrared sensor Public/Granted day:2010-08-26
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