Invention Grant
US08129218B2 Self-aligned, planar phase change memory elements and devices, systems employing the same and method of forming the same 有权
自对准的平面相变存储器元件和器件,采用该器件和器件的系统及其形成方法

  • Patent Title: Self-aligned, planar phase change memory elements and devices, systems employing the same and method of forming the same
  • Patent Title (中): 自对准的平面相变存储器元件和器件,采用该器件和器件的系统及其形成方法
  • Application No.: US13029673
    Application Date: 2011-02-17
  • Publication No.: US08129218B2
    Publication Date: 2012-03-06
  • Inventor: Jun Liu
  • Applicant: Jun Liu
  • Applicant Address: US ID Boise
  • Assignee: Micron Technology, Inc.
  • Current Assignee: Micron Technology, Inc.
  • Current Assignee Address: US ID Boise
  • Agency: Dickstein Shapiro LLP
  • Main IPC: H01L29/02
  • IPC: H01L29/02
Self-aligned, planar phase change memory elements and devices, systems employing the same and method of forming the same
Abstract:
Phase change memory elements, devices and systems using the same and methods of forming the same are disclosed. A memory element includes first and second electrodes, and a phase change material layer between the first and second electrodes. The phase change material layer has a first portion with a width less than a width of a second portion of the phase change material layer. The first electrode, second electrode and phase change material layer may be oriented at least partially along a same horizontal plane.
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