An electronic apparatus includes: a first integrated circuit including an internal component section, a nonvolatile memory, and an interface section; a test signal generation section configured to generate a test signal to be supplied to the first integrated circuit; a second integrated circuit including a processing section configured to process an output signal of the first integrated circuit, a signal processor to which the interface section of the first integrated circuit is connected and a detection section configured to detect decision information for deciding a result of the process of the test signal carried out by the processing section; and a control section configured to supply the test signal from the test signal generation section in place of the input signal to the first integrated circuit and issuing an instruction to the signal processor of the second integrated circuit to produce actual use adjustment data.