Invention Grant
- Patent Title: Self-position identifying method and device, and three-dimensional shape measuring method and device
- Patent Title (中): 自定位识别方法和装置,以及三维形状测量方法和装置
-
Application No.: US12096830Application Date: 2006-12-15
-
Publication No.: US08121399B2Publication Date: 2012-02-21
- Inventor: Toshihiro Hayashi , Yukihiro Kawano , Hideo Terada
- Applicant: Toshihiro Hayashi , Yukihiro Kawano , Hideo Terada
- Applicant Address: JP Tokyo
- Assignee: IHI Corporation
- Current Assignee: IHI Corporation
- Current Assignee Address: JP Tokyo
- Agency: Griffin & Szipl, P.C.
- Priority: JP2005-363320 20051216
- International Application: PCT/JP2006/325051 WO 20061215
- International Announcement: WO2007/069726 WO 20070621
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/32

Abstract:
The invention includes a step S1 for inputting into a computer coordinate values on a three-dimensional shape; a step S4 for structuring an environment model that partitions a spatial region, in which a three-dimensional shape exists, into a plurality of voxels of rectangular solids, and stores each position; and a step S5 for setting and recording a representative point and an error distribution thereof, within the voxel corresponding to the coordinate value. If there is no data in a previous measurement position, position matching is performed in a fine position matching step S7 so as to minimize an evaluation value regarding the distances between adjacent error distributions by rotating and translating a new measurement data and error distribution for the environment model for a previous measuring position, or rotating and translating an environment model for a new measuring position, relative to an environment model for a previous measuring position.
Public/Granted literature
- US20090167761A1 SELF-POSITION IDENTIFYING METHOD AND DEVICE, AND THREE-DIMENSIONAL SHAPE MEASURING METHOD AND DEVICE Public/Granted day:2009-07-02
Information query