Invention Grant
- Patent Title: Line defect detection circuit for detecting weak line
- Patent Title (中): 用于检测弱线的线路缺陷检测电路
-
Application No.: US11826311Application Date: 2007-07-13
-
Publication No.: US08120976B2Publication Date: 2012-02-21
- Inventor: Eunsung Seo , Kye-hyun Kyung
- Applicant: Eunsung Seo , Kye-hyun Kyung
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2006-0081837 20060828; KR10-2007-0019921 20070227
- Main IPC: G11C29/00
- IPC: G11C29/00
Abstract:
Example embodiments relate to a line defect detection circuit, including a first driver disposed at one end of a line and configured to drive the line using a first voltage or a second voltage in response to a control signal, and a second driver disposed at the other end of the line and configured to drive the line using the second voltage in response to a stress signal.
Public/Granted literature
- US20080049523A1 Line defect detection circuit for detecting weak line Public/Granted day:2008-02-28
Information query
