Invention Grant
- Patent Title: Device for sampling a plurality of parts of a light beam
- Patent Title (中): 用于对光束的多个部分进行取样的装置
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Application No.: US12521553Application Date: 2007-12-24
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Publication No.: US08120863B2Publication Date: 2012-02-21
- Inventor: Eric Journot
- Applicant: Eric Journot
- Applicant Address: FR Paris
- Assignee: Commissariat a l'Energie Atomique
- Current Assignee: Commissariat a l'Energie Atomique
- Current Assignee Address: FR Paris
- Agency: Nixon Peabody LLP
- Priority: FR0656021 20061228
- International Application: PCT/EP2007/064535 WO 20071224
- International Announcement: WO2008/080915 WO 20080710
- Main IPC: G02B5/04
- IPC: G02B5/04
Abstract:
Device for sampling a plurality of parts of a light beam, comprised of at least one optical component which comprises a plate made of a material which is transparent to the light beam, where this plate has first and second faces which are flat and parallel, and a third face which is flat and which forms a dihedron with the first face, where the angle of this dihedron is equal to π-α where 0
Public/Granted literature
- US20100321807A1 DEVICE FOR SAMPLING A PLURALITY OF PARTS OF A LIGHT BEAM Public/Granted day:2010-12-23
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