Invention Grant
- Patent Title: Method and device for measuring impedance
- Patent Title (中): 测量阻抗的方法和装置
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Application No.: US12495267Application Date: 2009-06-30
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Publication No.: US08120434B2Publication Date: 2012-02-21
- Inventor: Arto Rantala
- Applicant: Arto Rantala
- Applicant Address: FI Espoo
- Assignee: Valtion Teknillinen Tutkimuskeskus
- Current Assignee: Valtion Teknillinen Tutkimuskeskus
- Current Assignee Address: FI Espoo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: FI20085682 20080701
- Main IPC: H03K3/03
- IPC: H03K3/03 ; G01R27/00

Abstract:
The invention relates to a method and system and microchip for determining impedance of a variable impedance component. The method comprises tuning a tunable oscillator over a predefined tuning range, the tunable oscillator having the variable impedance component coupled as a load thereof. The frequency response of the tunable oscillator is measured as a function of said tuning. Finally, the measured frequency response is analyzed for determining the impedance of the variable impedance component. The invention makes possible to manufacture smaller and simpler monolithic sensor microchips.
Public/Granted literature
- US20100001740A1 METHOD AND DEVICE FOR MEASURING IMPEDANCE Public/Granted day:2010-01-07
Information query
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