Invention Grant
US08090069B2 Apparatus for generating clock signal with jitter and test apparatus including the same
失效
用于产生具有抖动的时钟信号和包括其的测试装置的装置
- Patent Title: Apparatus for generating clock signal with jitter and test apparatus including the same
- Patent Title (中): 用于产生具有抖动的时钟信号和包括其的测试装置的装置
-
Application No.: US12142396Application Date: 2008-06-19
-
Publication No.: US08090069B2Publication Date: 2012-01-03
- Inventor: Bong Guk Yu , Eun Tae Kim , Hyung Jung Kim , Gweon Do Jo
- Applicant: Bong Guk Yu , Eun Tae Kim , Hyung Jung Kim , Gweon Do Jo
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunication Research Institute
- Current Assignee: Electronics and Telecommunication Research Institute
- Current Assignee Address: KR Daejeon
- Agency: Staas & Halsey LLP
- Priority: KR10-2007-0132802 20071217
- Main IPC: H03D3/24
- IPC: H03D3/24

Abstract:
The present invention relates to an apparatus for generating a clock signal with jitter and a test apparatus including the same. The apparatus for generating a clock signal with jitter in accordance with the present invention includes a voltage-controlled crystal oscillator (VCXO) for generating an output signal including jitter components based on a driving power source having a specific waveform and a controlled voltage, a phase comparator for calculating a phase difference of a reference signal and the output signal, and a loop filter for generating the controlled voltage based on the phase difference calculated by the phase comparator. Accordingly, the PLL circuit unit generates a clock signal including jitter, so that the complexity and manufacturing cost of the apparatus can be reduced.
Public/Granted literature
- US20090316848A1 APPARATUS FOR GENERATING CLOCK SIGNAL WITH JITTER AND TEST APPARATUS INCLUDING THE SAME Public/Granted day:2009-12-24
Information query
IPC分类: