Invention Grant
- Patent Title: Method and apparatus for raised material detection
- Patent Title (中): 凸起材料检测方法和装置
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Application No.: US12308468Application Date: 2007-08-16
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Publication No.: US08089045B2Publication Date: 2012-01-03
- Inventor: Hansjorg Klock , Alexandre Gret , Cirillo Ghielmetti
- Applicant: Hansjorg Klock , Alexandre Gret , Cirillo Ghielmetti
- Applicant Address: GB Basingstoke
- Assignee: De La Rue International Limited
- Current Assignee: De La Rue International Limited
- Current Assignee Address: GB Basingstoke
- Agency: Oliff & Berridge, PLC
- Priority: GB0616495.8 20060818
- International Application: PCT/GB2007/003116 WO 20070816
- International Announcement: WO2008/020208 WO 20080221
- Main IPC: G06K9/74
- IPC: G06K9/74

Abstract:
A method is provided of detecting a region of raised material on a document surface. A surface of the document is illuminated with at least one angled radiation beam such that any raised material on the document surface reflects the radiation. The surface containing the raised material is imaged using at least one radiation detector. The image is then processed to detect the existence on the document surface of the raised material. The illuminating step causes a reflection and/or shadow to be generated from at least one edge of the raised material. The processing step detects the location of the material using the said reflection and/or shadow from the at least one edge.
Public/Granted literature
- US20090310126A1 Method and apparatus for raised material detection Public/Granted day:2009-12-17
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