Invention Grant
- Patent Title: Method and apparatus for measuring particle characteristics through mass detection
- Patent Title (中): 通过质量检测测量颗粒特性的方法和装置
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Application No.: US12087495Application Date: 2007-10-11
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Publication No.: US08087284B2Publication Date: 2012-01-03
- Inventor: Kenneth Babcock , Thomas Burg , Michel Godin , Scott Manalis
- Applicant: Kenneth Babcock , Thomas Burg , Michel Godin , Scott Manalis
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Agent Mark Rodgers
- International Application: PCT/US2007/081045 WO 20071011
- International Announcement: WO2008/045988 WO 20080417
- Main IPC: G01N9/00
- IPC: G01N9/00

Abstract:
Method for measuring a target particle property. A suspended microchannel resonator is calibrated to determine the relationship between a detected mass and a resonance frequency shift of the resonator. The target particle is suspended in a fluid and introduced into the resonator, and the resonator frequency shift due to the particle is measured. Target particle mass is calculated from the resonator frequency shift, the target particle density, and the fluid density. A target particle property such as size or volume is determined from the calculated target particle mass.
Public/Granted literature
- US20090044608A1 Method And Apparatus For Measuring Particle Characteristics through Mass Detection Public/Granted day:2009-02-19
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