Invention Grant
- Patent Title: Method and apparatus for loopback self testing
- Patent Title (中): 环回自检的方法和装置
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Application No.: US12335728Application Date: 2008-12-16
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Publication No.: US07992058B2Publication Date: 2011-08-02
- Inventor: Peter D. Maroni , Gregg B. Lesartre
- Applicant: Peter D. Maroni , Gregg B. Lesartre
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/08 ; H04B1/38 ; H04M1/24

Abstract:
A system and method for loopback self testing. A system includes a host device and an endpoint device. The host device transmits unencoded test symbols. The endpoint device loops back the unencoded test symbols to the host device. The host device drives at least some bits of each unencoded test symbol onto host device data signals and drives at least some bits of each unencoded test symbol onto host device control signals.
Public/Granted literature
- US20100153799A1 METHOD AND APPARATUS FOR LOOPBACK SELF TESTING Public/Granted day:2010-06-17
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