Invention Grant
- Patent Title: Resistance variable memory apparatus
- Patent Title (中): 电阻变量存储装置
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Application No.: US12602414Application Date: 2008-05-15
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Publication No.: US07990754B2Publication Date: 2011-08-02
- Inventor: Ryotaro Azuma , Kazuhiko Shimakawa , Satoru Fujii
- Applicant: Ryotaro Azuma , Kazuhiko Shimakawa , Satoru Fujii
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2007-146913 20070601
- International Application: PCT/JP2008/001214 WO 20080515
- International Announcement: WO2008/149493 WO 20081211
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A resistance variable memory apparatus (100) of the present invention includes a current suppressing element (116) which is connected in series with each resistance variable layer (114) and whose threshold voltage is VF, and is configured to apply a first voltage V1 to a first wire (WL) associated with a selected nonvolatile memory element, apply a second voltage V2 to a second wire (BL) associated with the selected nonvolatile memory element, apply a third voltage V3 to a first wire (WL) which is not associated with the selected nonvolatile memory element and apply a fourth voltage V4 to a second wire (BL) which is not associated with the selected memory element when writing data or reading data, wherein V2≦V3
Public/Granted literature
- US20100172171A1 RESISTANCE VARIABLE MEMORY APPARATUS Public/Granted day:2010-07-08
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