Invention Grant
- Patent Title: Immersion exposure apparatus and device manufacturing method with residual liquid detector
- Patent Title (中): 浸没曝光装置及装置制造方法与残液检测器
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Application No.: US11651551Application Date: 2007-01-10
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Publication No.: US07990517B2Publication Date: 2011-08-02
- Inventor: Hiroaki Takaiwa , Takashi Horiuchi
- Applicant: Hiroaki Takaiwa , Takashi Horiuchi
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2004-026864 20040203
- Main IPC: G03B27/52
- IPC: G03B27/52

Abstract:
A lithographic projection apparatus includes a substrate table configured to hold a substrate, a projection system arranged to project a patterned beam of radiation onto the substrate, a liquid supply system configured to supply liquid to a space between the projection system and the substrate, and a residual liquid detector configured to detect liquid remaining on the substrate and/or the substrate table after an exposure is completed. A device manufacturing method includes projecting, using a projection system of a lithographic apparatus, a patterned beam of radiation through a liquid onto a substrate, the substrate being held by a substrate table, and, after the projecting is complete, detecting residual liquid on the substrate and/or the substrate table.
Public/Granted literature
- US20070109517A1 Exposure apparatus and device manufacturing method Public/Granted day:2007-05-17
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