Invention Grant
US07989754B2 Optical circuit and method for measuring monitor characteristic 有权
用于测量显示器特性的光电路和方法

  • Patent Title: Optical circuit and method for measuring monitor characteristic
  • Patent Title (中): 用于测量显示器特性的光电路和方法
  • Application No.: US12399387
    Application Date: 2009-03-06
  • Publication No.: US07989754B2
    Publication Date: 2011-08-02
  • Inventor: Hideshi Yoshida
  • Applicant: Hideshi Yoshida
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • Priority: JP2008-057279 20080307
  • Main IPC: H01J40/14
  • IPC: H01J40/14
Optical circuit and method for measuring monitor characteristic
Abstract:
An optical circuit includes a selector that supplies an output current from a first photodetector to a converter provided for a second photodetector, and a processor that imaginarily calculates the level of signal light output from an optical device, which is detected by the second photodetector, based upon the level of signal light input to the optical device, which is measured by measurement means, and upon conversion efficiencies of the first and second photodetectors and that thus calculates the correlation between the output signal light level and its monitored value output from the converter provided for the second photodetector.
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