Invention Grant
US07989303B2 Method of creating an alignment mark on a substrate and substrate 有权
在基板和基板上产生对准标记的方法

Method of creating an alignment mark on a substrate and substrate
Abstract:
In an embodiment, a method of creating an alignment mark on a substrate includes forming a plurality of lines segmented into electrically conducting line segments and space segments, thereby forming spaces between the lines to form a macroscopic structure in a first layer of the substrate, creating a plurality of electrically conducting trenches in a second layer of the substrate, and arranging the plurality of trenches to be in electrical contact with the line segments and overlapping the space segments at least partially.
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