Invention Grant
- Patent Title: X-ray system
- Patent Title (中): X光系统
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Application No.: US12497244Application Date: 2009-07-02
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Publication No.: US07988357B2Publication Date: 2011-08-02
- Inventor: Oliver Hornung , Jochen Miguel Löseken , Michael Meyer
- Applicant: Oliver Hornung , Jochen Miguel Löseken , Michael Meyer
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Lempia Summerfield Katz LLC
- Priority: DE102008032294 20080709
- Main IPC: H05G1/02
- IPC: H05G1/02 ; H05G1/00
Abstract:
An x-ray system is provided. The x-ray system includes an x-ray emitter which can be adjusted by at least one arm as a first x-ray component and a recording system which can be adjusted independently of the at least one arm. The recording system may be adjusted by at least one additional arm as the further x-ray component. The two arms can be pivotably mounted about a common axis of rotation.
Public/Granted literature
- US20100008474A1 X-RAY SYSTEM Public/Granted day:2010-01-14
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