Invention Grant
- Patent Title: Method of qualifying light spots for optical measurements and measurement instrument employing method of qualifying light spots
- Patent Title (中): 光学测量光斑鉴定方法和采用光斑鉴定方法的测量仪器
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Application No.: US12607368Application Date: 2009-10-28
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Publication No.: US07988293B2Publication Date: 2011-08-02
- Inventor: Thomas D. Raymond , John G. Dixson , Stephen W. Farrer , Wei Xiong , Daniel R. Neal
- Applicant: Thomas D. Raymond , John G. Dixson , Stephen W. Farrer , Wei Xiong , Daniel R. Neal
- Applicant Address: US CA Santa Ana
- Assignee: AMO Wavefront Sciences LLC.
- Current Assignee: AMO Wavefront Sciences LLC.
- Current Assignee Address: US CA Santa Ana
- Main IPC: A61B3/10
- IPC: A61B3/10

Abstract:
A method of determining a wavefront of a received light beam includes: (a) receiving a light beam; (b) producing a group of light spots from the light beam; (c) qualifying a set of the light spots for use in determining a wavefront of the received light beam; and (d) determining the wavefront of the received light beam using the qualified set of light spots. Qualifying the set of light spots includes, for each light spot: calculating a first calculated location of the light spot using a first calculation algorithm; calculating a second calculated location of the light spot using a second calculation algorithm; and when a difference between the first and second calculated locations for the light spot is greater than an agreement threshold, excluding the light spot from the set of light spots and/or from being employed in determining the wavefront of the received light beam.
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