Invention Grant
US07974131B2 Nonvolatile memory comprising a circuit capable of memory life time recognizing 有权
非易失性存储器,包括能够记忆寿命识别的电路

  • Patent Title: Nonvolatile memory comprising a circuit capable of memory life time recognizing
  • Patent Title (中): 非易失性存储器,包括能够记忆寿命识别的电路
  • Application No.: US12399718
    Application Date: 2009-03-06
  • Publication No.: US07974131B2
    Publication Date: 2011-07-05
  • Inventor: Masahiro Ise
  • Applicant: Masahiro Ise
  • Applicant Address: JP Kawasaki
  • Assignee: Fujitsu Limited
  • Current Assignee: Fujitsu Limited
  • Current Assignee Address: JP Kawasaki
  • Agency: Fujitsu Patent Center
  • Main IPC: G11C16/06
  • IPC: G11C16/06
Nonvolatile memory comprising a circuit capable of memory life time recognizing
Abstract:
A nonvolatile memory wherein remaining lifetimes of memory cells can be accurately determined is provided, the nonvolatile memory includes: plural memory cell groups, assigned with respective addresses, arranged for respective words and used for storing one word of data; plural dummy cell groups also assigned the respective addresses and having different ranks of rewriting lifetimes; a writing circuit which, when writing data into a memory cell group having a given address, also writes the data into a dummy cell group having the same address at the same time; a lifetime recognizing circuit which recognizes an estimated number of past writing times by determining whether each dummy cell group can be successfully accessed; and a control section which controls operations of the memory cell groups and the dummy cell groups in response to an externally given command.
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