Invention Grant
- Patent Title: Method for protecting circuits from damage due to currents and voltages during manufacture
- Patent Title (中): 在制造期间保护电路免受电流和电压损坏的方法
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Application No.: US12290483Application Date: 2008-10-31
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Publication No.: US07974055B2Publication Date: 2011-07-05
- Inventor: Wallace W. Lin
- Applicant: Wallace W. Lin
- Main IPC: H02H9/00
- IPC: H02H9/00 ; H02H3/22

Abstract:
A protection circuit network includes one or more protection devices, used to protect one or more devices in an integrated circuit (IC) design. The protection devices are globally coupled together, for connection to an internal or external power supply. During manufacture of the IC, the protection circuit network protects the at-risk devices. During operation of the IC, the protection circuit network is powered down, such that excessive current leakage is avoided.
Public/Granted literature
- US20090079003A1 Method for protecting circuits from damage due to currents and voltages during manufacture Public/Granted day:2009-03-26
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