Invention Grant
US07973906B2 Exposure apparatus, exposure method, method for manufacturing device
有权
曝光装置,曝光方法,制造装置的方法
- Patent Title: Exposure apparatus, exposure method, method for manufacturing device
- Patent Title (中): 曝光装置,曝光方法,制造装置的方法
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Application No.: US11902437Application Date: 2007-09-21
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Publication No.: US07973906B2Publication Date: 2011-07-05
- Inventor: Yoshitomo Nagahashi
- Applicant: Yoshitomo Nagahashi
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2003-362279 20031022
- Main IPC: G03B27/52
- IPC: G03B27/52 ; G03B27/42

Abstract:
An exposure apparatus has a projection optical system configured to project a pattern of a reticle onto a substrate, and exposes the substrate to light via the reticle and the projection optical system with a space between the projection optical system and the substrate filled with liquid. The apparatus includes a supply nozzle configured to supply liquid to the space, a supply path configured to supply the liquid to the supply nozzle, a bypass which branches from the supply path, and a supply control valve configured to change a flow rate of the liquid supplied from the supply path to the supply nozzle and a flow rate of the liquid supplied from the supply path to the bypass.
Public/Granted literature
- US20080018869A1 Exposure apparatus, exposure method, method for manufacturing device Public/Granted day:2008-01-24
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