Invention Grant
- Patent Title: Method and pixel for performing correlated double sampling
- Patent Title (中): 执行相关双重采样的方法和像素
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Application No.: US11136545Application Date: 2005-05-25
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Publication No.: US07973845B2Publication Date: 2011-07-05
- Inventor: Bart Dierickx , Jan Bogaerts
- Applicant: Bart Dierickx , Jan Bogaerts
- Applicant Address: BM Hamilton
- Assignee: ON Semiconductor Trading, Ltd.
- Current Assignee: ON Semiconductor Trading, Ltd.
- Current Assignee Address: BM Hamilton
- Priority: GB0411648.9 20040525
- Main IPC: H04N5/335
- IPC: H04N5/335 ; H03M1/34

Abstract:
A method and apparatus for performing correlated double sampling to remove low frequency noise. The method and apparatus includes an active pixel of an array of active pixels comprising a sensor circuit for collecting radiation induced charges and transducing them to a measurement signal corresponding to the amount of charge collected, two memory elements for storing the measurement signal at the beginning and the end of a first integration period respectively, and at least one further memory element for storing at least the measurement signal at the beginning of a next integration period.
Public/Granted literature
- US20050270394A1 Method and pixel for performing correlated double sampling Public/Granted day:2005-12-08
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