Invention Grant
- Patent Title: Image sensor comprising isolated germanium photodetectors integrated with a silicon substrate and silicon circuitry
- Patent Title (中): 图像传感器包括与硅衬底和硅电路集成的孤立的锗光电探测器
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Application No.: US12271601Application Date: 2008-11-14
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Publication No.: US07973377B2Publication Date: 2011-07-05
- Inventor: Clifford A. King , Conor S. Rafferty
- Applicant: Clifford A. King , Conor S. Rafferty
- Applicant Address: US AZ Tuscon
- Assignee: Infrared Newco, Inc.
- Current Assignee: Infrared Newco, Inc.
- Current Assignee Address: US AZ Tuscon
- Agency: Wolf, Greefield & Sacks, P.C.
- Main IPC: H01L27/14
- IPC: H01L27/14 ; H01L31/00 ; H01L31/0232 ; H01L29/82 ; H01L29/84

Abstract:
In accordance with the invention, an improved image sensor comprises an array of germanium photosensitive elements integrated with a silicon substrate and integrated with silicon readout circuits. The silicon transistors are formed first on a silicon substrate, using well known silicon wafer fabrication techniques. The germanium elements are subsequently formed overlying the silicon by epitaxial growth. The germanium elements are advantageously grown within surface openings of a dielectric cladding. Wafer fabrication techniques are applied to the elements to form isolated germanium photodiodes. Since temperatures needed for germanium processing are lower than those for silicon processing, the formation of the germanium devices need not affect the previously formed silicon devices. Insulating and metallic layers are then deposited and patterned to interconnect the silicon devices and to connect the germanium devices to the silicon circuits. The germanium elements are thus integrated to the silicon by epitaxial growth and integrated to the silicon circuitry by common metal layers.
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