Invention Grant
- Patent Title: Semiconductor device and manufacturing method thereof
- Patent Title (中): 半导体装置及其制造方法
-
Application No.: US12650009Application Date: 2009-12-30
-
Publication No.: US07973367B2Publication Date: 2011-07-05
- Inventor: Kenshi Kanegae , Akihiko Tsuzumitani , Atsushi Ikeda
- Applicant: Kenshi Kanegae , Akihiko Tsuzumitani , Atsushi Ikeda
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2004-204727 20040712
- Main IPC: H01L27/092
- IPC: H01L27/092 ; H01L27/095

Abstract:
In order that a top surface of a gate electrode does not have sharp portions, ends of the top surface of the gate electrode are rounded before refractory metal is deposited for silicidation. This reduces intensive application of film stresses which are generated in heat treatment, enabling formation of a silicide layer with a uniform, sufficient thickness.
Public/Granted literature
- US20100102396A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF Public/Granted day:2010-04-29
Information query
IPC分类: