Invention Grant
US07973283B2 Method for regulating scanning sample surface charge in continuous and leap-and-scan scanning mode imaging process
有权
在连续扫描和扫描扫描模式成像过程中调节扫描样品表面电荷的方法
- Patent Title: Method for regulating scanning sample surface charge in continuous and leap-and-scan scanning mode imaging process
- Patent Title (中): 在连续扫描和扫描扫描模式成像过程中调节扫描样品表面电荷的方法
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Application No.: US12232834Application Date: 2008-09-25
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Publication No.: US07973283B2Publication Date: 2011-07-05
- Inventor: Joe Wang , Jack Jau
- Applicant: Joe Wang , Jack Jau
- Applicant Address: TW Hsinchu
- Assignee: Hermes Microvision, Inc.
- Current Assignee: Hermes Microvision, Inc.
- Current Assignee Address: TW Hsinchu
- Agency: Rosenberg, Klein & Lee
- Main IPC: G01N23/00
- IPC: G01N23/00

Abstract:
A method for regulating sample surface charge has been proposed in this invention. The processes of applying a charged particle beam to a first area and applying a flood energized beam gun with gaseous molecules to a second area are executed in the method when the sample is in both continuous and Leap & Scan movements. The second area is located at a predetermined distance from the first area behind or ahead of the first area being scanned with respect to the movement of the sample. Thus, the surface of the sample may be regulated.
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