Invention Grant
- Patent Title: Method for forming metallic materials comprising semi-conductors
- Patent Title (中): 用于形成包含半导体的金属材料的方法
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Application No.: US12965030Application Date: 2010-12-10
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Publication No.: US07972911B1Publication Date: 2011-07-05
- Inventor: Veronique Carron , Fabrice Nemouchi
- Applicant: Veronique Carron , Fabrice Nemouchi
- Applicant Address: FR Paris
- Assignee: Commissariat A l'Energie Atomique Et Aux Energies Alternatives
- Current Assignee: Commissariat A l'Energie Atomique Et Aux Energies Alternatives
- Current Assignee Address: FR Paris
- Agency: Oliff & Berridge, PLC
- Priority: FR0905976 20091210
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/84 ; H01L21/44 ; H01L21/302 ; H01L21/461

Abstract:
The method for forming first and second metal-based materials comprises providing a substrate comprising an area made from a first semi-conductor material and an area made from a second semi-conductor material comprising germanium separated by a pattern made from dielectric material, depositing a metal layer and performing a first heat treatment in an atmosphere comprising a quantity of oxygen comprised between 0.01% and 5%. The metal layer reacts with the first semi-conductor material and the second semi-conductor material comprising germanium to respectively form the first metal-based material and the second metal-based material containing germanium.
Public/Granted literature
- US20110143534A1 METHOD FOR FORMING METALLIC MATERIALS COMPRISING SEMI-CONDUCTORS Public/Granted day:2011-06-16
Information query
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