Invention Grant
US07958466B1 Method and apparatus for calculating a scalar quality metric for quantifying the quality of a design solution
有权
用于计算用于量化设计解决方案质量的标量质量度量的方法和装置
- Patent Title: Method and apparatus for calculating a scalar quality metric for quantifying the quality of a design solution
- Patent Title (中): 用于计算用于量化设计解决方案质量的标量质量度量的方法和装置
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Application No.: US11396777Application Date: 2006-04-01
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Publication No.: US07958466B1Publication Date: 2011-06-07
- Inventor: Ryan Fung
- Applicant: Ryan Fung
- Applicant Address: US CA San Jose
- Assignee: Altera Corporation
- Current Assignee: Altera Corporation
- Current Assignee Address: US CA San Jose
- Agent L. Cho
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F9/455 ; G06F11/22
Abstract:
A method for generating a scalar quality metric value for a design solution includes reflectings one or more qualities of the design solution with respect to two or more domains in the system. Other embodiments are also disclosed.
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