Invention Grant
- Patent Title: Symbol rate testing method based on signal waveform analysis
- Patent Title (中): 基于信号波形分析的符号率测试方法
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Application No.: US11688880Application Date: 2007-03-21
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Publication No.: US07957459B2Publication Date: 2011-06-07
- Inventor: Yu-Yi Cheng , Kou-Cheng Yeh , Chun-Chen Chen , Teng-Chun Wu
- Applicant: Yu-Yi Cheng , Kou-Cheng Yeh , Chun-Chen Chen , Teng-Chun Wu
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Priority: TW95149972A 20061229
- Main IPC: H04B3/46
- IPC: H04B3/46 ; H04B17/00 ; H04Q1/20

Abstract:
A symbol rate testing method based on signal waveform analysis is provided. A signal with a plurality of quasi bits 1 and a plurality of quasi bits 0 is received and sampled within an acquiring time. Maximum values of the quasi bits 1 are obtained by calculating sampling values of the signal at various sampling points. A minimum value among the maximum values is determined as a critical value. Whether a quasi bit 1 is a bit 1 or not is determined according to the critical value, and a total number of the bits 1 within the acquiring time is counted. Similarly, a number of the bits 0 within the acquiring time are also obtained. Thus, the symbol rate is obtained according to the above information.
Public/Granted literature
- US20080159164A1 SYMBOL RATE TESTING METHOD BASED ON SIGNAL WAVEFORM ANALYSIS Public/Granted day:2008-07-03
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