Invention Grant
US07957458B2 Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device
失效
抖动测量装置，抖动测量方法，测试装置和电子装置
- Patent Title: Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device
- Patent Title (中): 抖动测量装置，抖动测量方法，测试装置和电子装置
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Application No.: US11378407Application Date: 2006-03-17
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Publication No.: US07957458B2Publication Date: 2011-06-07
- Inventor: Kiyotaka Ichiyama , Masahiro Ishida , Takahiro Yamaguchi , Mani Soma
- Applicant: Kiyotaka Ichiyama , Masahiro Ishida , Takahiro Yamaguchi , Mani Soma
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Osha • Liang LLP
- Main IPC: H04Q1/20
- IPC: H04Q1/20
Abstract:
A jitter measuring apparatus measures timing jitter of a signal-under-test. The jitter measuring apparatus includes a pulse generator for outputting a pulse signal of a predetermined pulse width for an edge of the signal-under-test, and a jitter measuring sub-unit for extracting the timing jitter on the basis of a duty ratio of each cycle of the signal output by the pulse generator.
Public/Granted literature
- US20060182170A1 Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device Public/Granted day:2006-08-17
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