An optical pickup inspection device 3 sends to an actuator drive circuit 16 a command for changing defocus offset amount to set defocus offset amounts, and calculates jitter values for each of the defocus offset amounts based on a reproduction signal from a reproduction signal generation circuit 14. Then, the device 3 determines a quadric approximating curve of jitter values relative to the defocus offset amounts and calculates a correlation coefficient R2 of the quadric approximating curve and measured values. If the correlation coefficient R2 is lower than a threshold value, the setting of defocus offset amounts and the calculation of jitter values are executed once again, otherwise, a defocus offset amount corresponding to a bottom value of jitter in the quadric approximating curve is determined as an optimum value of the defocus offset amount. Thus, a less-error, high-accuracy optimum value of the defocus offset amount can be obtained.