Invention Grant
- Patent Title: Test writing method and information recording device
- Patent Title (中): 测试写作方法和信息记录装置
-
Application No.: US12219580Application Date: 2008-07-24
-
Publication No.: US07957240B2Publication Date: 2011-06-07
- Inventor: Junko Ushiyama , Hiroyuki Minemura
- Applicant: Junko Ushiyama , Hiroyuki Minemura
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Stites & Harbison PLLC
- Agent Juan Carlos A. Marquez, Esq.
- Priority: JP2005-033771 20050210
- Main IPC: G11B7/00
- IPC: G11B7/00

Abstract:
The object of the present invention is to provide a test writing method for seeking the optimum write power correctly and in a short time under a high speed recording condition in a test writing method and an information recording device for recording information by forming different marks from the unrecorded part by injecting energy onto the recording medium. To achieve the above object, even number length marks and odd number length marks are separately test written in the 2T strategy to seek the respective optimum write power. Due to the possibility of enhancing the precision of test writing, a good recording ability can be obtained.
Public/Granted literature
- US20090252005A1 Test writing method and information recording device Public/Granted day:2009-10-08
Information query
IPC分类: