Invention Grant
- Patent Title: Semiconductor memory device with improved resistance to disturbance and improved writing characteristic
- Patent Title (中): 半导体存储器件具有改进的抗干扰性和改进的写入特性
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Application No.: US11753111Application Date: 2007-05-24
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Publication No.: US07957176B2Publication Date: 2011-06-07
- Inventor: Nobuaki Otsuka
- Applicant: Nobuaki Otsuka
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2006-146521 20060526
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A semiconductor memory device includes a first inverter ad a second inverter, a first power supply control circuit, and a second power supply control circuit. The first and second inverters constitute a memory cell and each have an input terminal and an output terminal connected crosswise to an output terminal and an input terminal, respectively, of the other. The first power supply control circuit supplies a first voltage to the first inverter. The second power supply control circuit supplies a second voltage to the second inverter. The first and second power supply control circuits control the first and second voltages, respectively, supplied to the first and second inverters in a selected memory cell for a writing operation in accordance with write data.
Public/Granted literature
- US20070274124A1 SEMICONDUCTOR MEMORY DEVICE WITH IMPROVED RESISTANCE TO DISTURBANCE AND IMPROVED WRITING CHARACTERISTIC Public/Granted day:2007-11-29
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