Invention Grant
- Patent Title: Surface plasmon assisted microscope
- Patent Title (中): 表面等离子体辅助显微镜
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Application No.: US12018107Application Date: 2008-01-22
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Publication No.: US07956989B2Publication Date: 2011-06-07
- Inventor: Zygmunt Gryczynski , Ignacy Gryczynski , Nils Calander , Julian Borejdo
- Applicant: Zygmunt Gryczynski , Ignacy Gryczynski , Nils Calander , Julian Borejdo
- Applicant Address: US TX Fort Worth
- Assignee: University of North Texas Health Science Center at Fort Worth
- Current Assignee: University of North Texas Health Science Center at Fort Worth
- Current Assignee Address: US TX Fort Worth
- Agency: Chalker Flores, LLP
- Agent Edwin S. Flores
- Main IPC: G01N1/00
- IPC: G01N1/00

Abstract:
The present invention includes a microscope and a method for using the microscope for single molecule with reduced photobleaching of a fluorophore (20) that includes a light translucent material (16); a metal layer (18) disposed on the light translucent material (16); a medium (15) disposed on the metal layer (18), the medium (15) having one or more fluorophores (20) capable of binding a target analyte (e.g., inside a cell); a microscope positioned to observe the surface plasmon emissions from the one or more fluorophores (20) within 50 nanometers of the surface of the metal layer (18); an excitation source capable of exciting the one or more fluorophores (20), the excitation source positioned to strike the light translucent material (16) at a first angle; and a light detector (38) that selectively detects emitted light generated by excited fluorophores (20) at a second angle (22), wherein light emitted by the one or more fluorophores (20) at the surface plasmon angle is detected through the microscope, such that single molecules may be detected without significantly degrading fluorophore (20) emissions.
Public/Granted literature
- US20080231834A1 SURFACE PLASMON ASSISTED MICROSCOPE Public/Granted day:2008-09-25
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