Invention Grant
- Patent Title: Semiconductor device and method of manufacturing the same
- Patent Title (中): 半导体装置及其制造方法
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Application No.: US12591193Application Date: 2009-11-12
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Publication No.: US07956467B2Publication Date: 2011-06-07
- Inventor: Tatsuya Usami
- Applicant: Tatsuya Usami
- Applicant Address: JP Kawasaki-shi, Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kawasaki-shi, Kanagawa
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2008-290977 20081113
- Main IPC: H01L23/48
- IPC: H01L23/48

Abstract:
A method includes burying a conductive pattern in an insulating film made of SiOH, SiCOH or organic polymer, treating surfaces of the insulating film and the conductive pattern with plasma which includes a hydrocarbon gas as a treatment gas, and forming a diffusion barrier film, which is formed of an SiCH film, an SiCHN film, an SiCHO film or an SiCHON film, over the insulating film and the conductive pattern with performing a plasma CVD by adding an Si-containing gas to the treatment gas while increasing an addition amount gradually or in a step by step manner.
Public/Granted literature
- US20100117234A1 Semiconductor device and method of manufacturing the same Public/Granted day:2010-05-13
Information query
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