Invention Grant
US07955992B2 Method of passivating and encapsulating CdTe and CZT segmented detectors
有权
钝化和封装CdTe和CZT分段检测器的方法
- Patent Title: Method of passivating and encapsulating CdTe and CZT segmented detectors
- Patent Title (中): 钝化和封装CdTe和CZT分段检测器的方法
-
Application No.: US12188501Application Date: 2008-08-08
-
Publication No.: US07955992B2Publication Date: 2011-06-07
- Inventor: Henry Chen , Pinghe Lu , Salah Awadalla
- Applicant: Henry Chen , Pinghe Lu , Salah Awadalla
- Applicant Address: CA Saanichton, BC
- Assignee: Redlen Technologies, Inc.
- Current Assignee: Redlen Technologies, Inc.
- Current Assignee Address: CA Saanichton, BC
- Agency: The Marbury Law Group, PLLC
- Main IPC: H01L21/00
- IPC: H01L21/00
Abstract:
A method of forming a passivation layer comprises contacting at least one surface of a wide band-gap semiconductor material with a passivating agent comprising an alkali hypochloride to form the passivation layer on said at least one surface. The passivation layer may be encapsulated with a layer of encapsulation material.
Public/Granted literature
- US20100032579A1 METHOD OF PASSIVATING AND ENCAPSULATING CdTe AND CZT SEGMENTED DETECTORS Public/Granted day:2010-02-11
Information query
IPC分类:
