Invention Grant
US07955990B2 Method for improved thickness repeatability of PECVD deposited carbon films
有权
改善PECVD沉积碳膜厚度重复性的方法
- Patent Title: Method for improved thickness repeatability of PECVD deposited carbon films
- Patent Title (中): 改善PECVD沉积碳膜厚度重复性的方法
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Application No.: US12334220Application Date: 2008-12-12
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Publication No.: US07955990B2Publication Date: 2011-06-07
- Inventor: Jon Henri , Gishun Hsu , Robert Sculac , Scott Stoddard
- Applicant: Jon Henri , Gishun Hsu , Robert Sculac , Scott Stoddard
- Applicant Address: US CA San Jose
- Assignee: Novellus Systems, Inc.
- Current Assignee: Novellus Systems, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Main IPC: H01L21/31
- IPC: H01L21/31

Abstract:
Provided herein are improved methods of depositing carbon-based films using acetylene as a precursor. The methods involve using a low-vapor pressure solvent, e.g., dimethylfluoride (DMF) to stabilize the acetylene and delivering the acetylene to a deposition chamber. The methods provide improved wafer-to-wafer thickness uniformity and increase the usable amount of acetylene in an acetylene source to over 95%.
Public/Granted literature
- US20100151691A1 METHOD FOR IMPROVED THICKNESS REPEATABILITY OF PECVD DEPOSITED CARBON FILMS Public/Granted day:2010-06-17
Information query
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