Invention Grant
US07955777B2 Compound, acid generator, resist composition and method of forming resist pattern
有权
化合物,酸发生剂,抗蚀剂组合物和形成抗蚀剂图案的方法
- Patent Title: Compound, acid generator, resist composition and method of forming resist pattern
- Patent Title (中): 化合物,酸发生剂,抗蚀剂组合物和形成抗蚀剂图案的方法
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Application No.: US12327549Application Date: 2008-12-03
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Publication No.: US07955777B2Publication Date: 2011-06-07
- Inventor: Takehiro Seshimo , Yoshiyuki Utsumi , Yoshitaka Komuro , Keita Ishiduka , Akiya Kawaue , Kyoko Ohshita
- Applicant: Takehiro Seshimo , Yoshiyuki Utsumi , Yoshitaka Komuro , Keita Ishiduka , Akiya Kawaue , Kyoko Ohshita
- Applicant Address: JP Kawasaki-shi
- Assignee: Tokyo Ohka Kogyo Co., Ltd.
- Current Assignee: Tokyo Ohka Kogyo Co., Ltd.
- Current Assignee Address: JP Kawasaki-shi
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: JP2007-315239 20071205
- Main IPC: G03F7/00
- IPC: G03F7/00 ; G03F7/004

Abstract:
There are provided a compound represented by a general formula (b1-1) shown below suitable as an acid generator for a resist composition, a compound represented by a general formula (I) shown below suitable as a precursor for the compound represented by the general formula (b1-1), an acid generator, a resist composition, and a method of forming a resist pattern.[Chemical Formula 1] X—Q1—Y1—SO3−M+ (I) X—Q1—Y1—SO3−A+ (b1-1) (wherein, Q1 represents a bivalent linking group or a single bond; Y1 represents an alkylene group which may contain a substituent group or a fluorinated alkylene group which may contain a substituent group; X represents an aromatic cyclic group of 5 to 30 carbon atoms which contains a fluorine atom and may contain a substituent group; M+ represents an alkali metal ion; and A+ represents an organic cation.).
Public/Granted literature
- US20090162787A1 NOVEL COMPOUND, ACID GENERATOR, RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN Public/Granted day:2009-06-25
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