Invention Grant
- Patent Title: Method for applying selectively a layer to a structured substrate by the usage of a temperature gradient in the substrate
- Patent Title (中): 通过在衬底中使用温度梯度将层选择性地施加到结构化衬底的方法
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Application No.: US11791549Application Date: 2005-11-23
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Publication No.: US07955645B2Publication Date: 2011-06-07
- Inventor: Felix Mayer , Christoph Kleinlogel
- Applicant: Felix Mayer , Christoph Kleinlogel
- Applicant Address: CH
- Assignee: Sensirion AG
- Current Assignee: Sensirion AG
- Current Assignee Address: CH
- Agency: Cooper & Dunham LLP
- Priority: CH1937/04 20041124
- International Application: PCT/CH2005/000691 WO 20051123
- International Announcement: WO2006/056090 WO 20060601
- Main IPC: B05D1/26
- IPC: B05D1/26 ; H01L21/283

Abstract:
A semiconductor wafer (10) is structured such that fine structures (3), such as membranes, bridges or tongues, with a thickness d
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