Invention Grant
US07955645B2 Method for applying selectively a layer to a structured substrate by the usage of a temperature gradient in the substrate 有权
通过在衬底中使用温度梯度将层选择性地施加到结构化衬底的方法

  • Patent Title: Method for applying selectively a layer to a structured substrate by the usage of a temperature gradient in the substrate
  • Patent Title (中): 通过在衬底中使用温度梯度将层选择性地施加到结构化衬底的方法
  • Application No.: US11791549
    Application Date: 2005-11-23
  • Publication No.: US07955645B2
    Publication Date: 2011-06-07
  • Inventor: Felix MayerChristoph Kleinlogel
  • Applicant: Felix MayerChristoph Kleinlogel
  • Applicant Address: CH
  • Assignee: Sensirion AG
  • Current Assignee: Sensirion AG
  • Current Assignee Address: CH
  • Agency: Cooper & Dunham LLP
  • Priority: CH1937/04 20041124
  • International Application: PCT/CH2005/000691 WO 20051123
  • International Announcement: WO2006/056090 WO 20060601
  • Main IPC: B05D1/26
  • IPC: B05D1/26 H01L21/283
Method for applying selectively a layer to a structured substrate by the usage of a temperature gradient in the substrate
Abstract:
A semiconductor wafer (10) is structured such that fine structures (3), such as membranes, bridges or tongues, with a thickness d
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