Invention Grant
- Patent Title: Analysis system
- Patent Title (中): 分析系统
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Application No.: US12723009Application Date: 2010-03-12
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Publication No.: US07949496B2Publication Date: 2011-05-24
- Inventor: Stefan Lindberg , Hakan Hedlund , Jim Kummelstam , Jarl-Ove Lindberg
- Applicant: Stefan Lindberg , Hakan Hedlund , Jim Kummelstam , Jarl-Ove Lindberg
- Applicant Address: SE Strangnas
- Assignee: SPM Instrument AB
- Current Assignee: SPM Instrument AB
- Current Assignee Address: SE Strangnas
- Agency: Young & Thompson
- Priority: SE0200147 20020118; SE0200215 20020125
- Main IPC: G06F11/30
- IPC: G06F11/30

Abstract:
An apparatus for analyzing the condition of a machine having a rotating shaft, comprising: at least one input for receiving measurement data from a sensor for surveying a measuring point of the machine, the measurement data being dependent on rotation of the shaft; a data processor for processing condition data dependent on the measurement data; the data processor performing a plurality of condition monitoring functions (F1, F2 Fn). At least one of the plurality of condition monitoring functions (F1, F2 Fn) is a restricted function having a disabled state and an enabled state; the disabled state prohibiting complete execution of the condition monitoring function, and the enabled sate allowing execution. The apparatus allows a limited amount of use of the at least one restricted condition monitoring function; and at least one of the plurality of condition monitoring functions (F1, F2, Fn) is an unrestricted function.
Public/Granted literature
- US20100169047A1 ANALYSIS SYSTEM Public/Granted day:2010-07-01
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