Invention Grant
- Patent Title: System and method for calibrating an X-ray detector
- Patent Title (中): 用于校准X射线检测器的系统和方法
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Application No.: US11583669Application Date: 2006-10-19
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Publication No.: US07949174B2Publication Date: 2011-05-24
- Inventor: Joseph J. Manak
- Applicant: Joseph J. Manak
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agency: Fletcher Yoder
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method and system are provided for generating high and low-frequency components for the pixels of a detector array. The method includes the act of generating a gain map image comprised of gain coefficients for one or more pixels of a detector array. A frequency-based transform is applied to the gain map image to generate a high-frequency component and a low-frequency component of the gain map coefficients for each pixel. The high and low-frequency components may be differentially applied in the processing of images.
Public/Granted literature
- US20080093545A1 System and method for calibrating an X-ray detector Public/Granted day:2008-04-24
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