Invention Grant
- Patent Title: Semiconductor integrated circuit and operation method for the same
- Patent Title (中): 半导体集成电路及其运算方法相同
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Application No.: US12851175Application Date: 2010-08-05
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Publication No.: US07948298B2Publication Date: 2011-05-24
- Inventor: Tadashi Kameyama , Takayasu Ito , Seiichi Saito , Koji Sato
- Applicant: Tadashi Kameyama , Takayasu Ito , Seiichi Saito , Koji Sato
- Applicant Address: JP Kawasaki-shi
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kawasaki-shi
- Agency: Miles & Stockbridge P.C.
- Priority: JP2008-137778 20080527
- Main IPC: H01L35/00
- IPC: H01L35/00

Abstract:
The semiconductor integrated circuit is provided, in which an external temperature control or temperature monitoring is possible, with little influence by the noise of a system board which mounts the semiconductor integrated circuit. The semiconductor integrated circuit includes the temperature detection circuit which detects the chip temperature, and the functional module which flows a large operating current. An external terminal which supplies operating voltage, and an external terminal which supplies ground voltage are coupled to the functional module. The temperature detection circuit generates a temperature detection signal and a reference signal. The reference signal and the temperature detection signal are led out to the exterior of the semiconductor integrated circuit via a first external output terminal and a second external output terminal, respectively, and are supplied to an external temperature control/monitoring circuit which has a circuitry type of a differential amplifier circuit.
Public/Granted literature
- US20100301924A1 SEMICONDUCTOR INTEGRATED CIRCUIT AND OPERATION METHOD FOR THE SAME Public/Granted day:2010-12-02
Information query
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