Invention Grant
- Patent Title: Manufacturing method and manufacturing apparatus of semiconductor substrate
- Patent Title (中): 半导体衬底的制造方法和制造装置
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Application No.: US12350984Application Date: 2009-01-09
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Publication No.: US07947570B2Publication Date: 2011-05-24
- Inventor: Takatsugu Omata , Tomoaki Moriwaka , Hideto Ohnuma
- Applicant: Takatsugu Omata , Tomoaki Moriwaka , Hideto Ohnuma
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2008-007032 20080116
- Main IPC: H01L21/77
- IPC: H01L21/77 ; H01L21/78

Abstract:
It is an object to provide a homogeneous semiconductor substrate in which defective bonding is reduced. Such a semiconductor substrate can be formed by the steps of: disposing a first substrate in a substrate bonding chamber which includes a substrate supporting base where a plurality of openings is provided, substrate supporting mechanisms provided in the plurality of openings, and raising and lowering mechanisms which raise and lower the substrate supporting mechanisms; disposing a second substrate over the first substrate so as not to be in contact with the first substrate; and bonding the first substrate to the second substrate by using the raising and lowering mechanisms to raise the substrate supporting mechanisms.
Public/Granted literature
- US20090181518A1 MANUFACTURING METHOD AND MANUFACTURING APPARATUS OF SEMICONDUCTOR SUBSTRATE Public/Granted day:2009-07-16
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