Invention Grant
- Patent Title: Common performance trace mechanism
- Patent Title (中): 常见的性能跟踪机制
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Application No.: US11529978Application Date: 2006-09-29
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Publication No.: US07941789B2Publication Date: 2011-05-10
- Inventor: Ventsislav I. Ivanov , Hristo I. Dobtchev
- Applicant: Ventsislav I. Ivanov , Hristo I. Dobtchev
- Applicant Address: DE Walldorf
- Assignee: SAP AG
- Current Assignee: SAP AG
- Current Assignee Address: DE Walldorf
- Agency: Blakley, Sokoloff, Taylor & Zafman LLP
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
A method for providing a mechanism for generating a common format for trace data is disclosed. In one embodiment, the method includes generating trace data at a plurality of providers, the trace data including a first trace data having a first format and a second trace data having a second format, receiving the trace data at a database via a common interface, storing the trace data at the database in compliance with a common format, and providing access to the trace data stored at the database via a user interface.
Public/Granted literature
- US20080127108A1 Common performance trace mechanism Public/Granted day:2008-05-29
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