Invention Grant
- Patent Title: Jones phase microscopy of transparent samples
- Patent Title (中): 透明样品的琼斯相显微镜
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Application No.: US12460808Application Date: 2009-07-24
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Publication No.: US07940399B2Publication Date: 2011-05-10
- Inventor: Gabriel Popescu , Zhuo Wang
- Applicant: Gabriel Popescu , Zhuo Wang
- Applicant Address: US IL Urbana
- Assignee: The Board of Trustees of the University of Illinois
- Current Assignee: The Board of Trustees of the University of Illinois
- Current Assignee Address: US IL Urbana
- Agency: Sunstein Kann Murphy & Timbers LLP
- Main IPC: G01B11/02
- IPC: G01B11/02

Abstract:
Methods for displaying anisotropic properties of an object. The object is illuminated with a first test beam characterized by a first polarization that, after traversing the object, is combined with a reference beam. The combined light of the first transmitted test beam and the reference beam is analyzed by a first pair of polarization analyzers, and interference created between the first transmitted test beam and the reference beam as analyzed by the first pair of analyzers is detected to derive intensity, phase and polarization of the first transmitted test beam. The same is then done with a second test beam that has a polarization with a component orthogonal to the first polarization. Based on the two analyzed beams, complex elements of a Jones matrix associated with the object in a local coordinate system are determined and a plurality of tangible images are displayed that characterize the object based on the complex elements of the Jones matrix.
Public/Granted literature
- US20100027027A1 Jones phase microscopy of transparent samples Public/Granted day:2010-02-04
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