Invention Grant
- Patent Title: Method for calibrating analog-to-digital converting circuits
- Patent Title (中): 校准模拟 - 数字转换电路的方法
-
Application No.: US12487626Application Date: 2009-06-18
-
Publication No.: US07940199B2Publication Date: 2011-05-10
- Inventor: Chien-Ming Chen , Chen-Yu Hsiao
- Applicant: Chien-Ming Chen , Chen-Yu Hsiao
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
- Assignee: Mediatek Inc.
- Current Assignee: Mediatek Inc.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H03M1/10
- IPC: H03M1/10
Abstract:
A method for calibrating at least one analog-to-digital converting circuits includes: during a wafer level probe testing or a chip level testing, inputting at least one calibration signal into the analog-to-digital converting circuit to generate at least one digital signal; and calibrating gain or offset of the analog-to-digital converting circuit according to at least the digital signal.
Public/Granted literature
- US20100127905A1 METHOD FOR CALIBRATING ANALOG-TO-DIGITAL CONVERTING CIRCUITS Public/Granted day:2010-05-27
Information query
