Invention Grant
- Patent Title: Systems and methods for detecting anomalies on internal surfaces of hollow elongate structures using time domain or frequency domain reflectometry
- Patent Title (中): 使用时域或频域反射法检测中空细长结构内表面异常的系统和方法
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Application No.: US11998544Application Date: 2007-11-30
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Publication No.: US07940061B2Publication Date: 2011-05-10
- Inventor: Ronald J. Focia , Charles A. Frost
- Applicant: Ronald J. Focia , Charles A. Frost
- Applicant Address: US NY Manhasset
- Assignee: Profile Technologies, Inc.
- Current Assignee: Profile Technologies, Inc.
- Current Assignee Address: US NY Manhasset
- Agency: Schacht Law Office, Inc.
- Agent Michael R. Schacht
- Main IPC: G01R27/08
- IPC: G01R27/08

Abstract:
Systems and methods for detecting anomalies, such as corrosion, on internal surfaces of hollow elongate bodies, such as pipelines. The pipeline is treated as a circular waveguide, and a fast rise time pulse or a spectrum of electromagnetic waves is launched down the waveguide to perform time domain, or equivalent of time domain (e.g., frequency domain), reflectometry. Anomalies in the internal structure of the pipeline cause reflections which can be measured and related to the physical parameters of the pipeline structure and identified to a particular location.
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