Invention Grant
US07939898B2 Diffusion variability control and transistor device sizing using threshold voltage implant
有权
扩散变异性控制和晶体管器件尺寸使用阈值电压植入
- Patent Title: Diffusion variability control and transistor device sizing using threshold voltage implant
- Patent Title (中): 扩散变异性控制和晶体管器件尺寸使用阈值电压植入
-
Application No.: US12271907Application Date: 2008-11-16
-
Publication No.: US07939898B2Publication Date: 2011-05-10
- Inventor: Michael C. Smayling , Scott T. Becker
- Applicant: Michael C. Smayling , Scott T. Becker
- Applicant Address: US CA Los Gatos
- Assignee: Tela Innovations, Inc.
- Current Assignee: Tela Innovations, Inc.
- Current Assignee Address: US CA Los Gatos
- Agency: Martine Penilla & Gencarella, LLP
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L29/94

Abstract:
A transistor is defined to include a substrate portion and a diffusion region defined in the substrate portion so as to provide an operable transistor threshold voltage. An implant region is defined within a portion of the diffusion region so as to transform the operable transistor threshold voltage of the diffusion region portion into an inoperably high transistor threshold voltage. A gate electrode is defined to extend over both the diffusion region and the implant region. A first portion of the gate electrode defined over the diffusion region forms a first transistor segment having the operable transistor threshold voltage. A second portion of the gate electrode defined over the implant region forms a second transistor segment having the inoperably high transistor threshold voltage. Therefore, a boundary of the implant region defines a boundary of the operable first transistor segment.
Public/Granted literature
- US20090127636A1 Diffusion Variability Control and Transistor Device Sizing Using Threshold Voltage Implant Public/Granted day:2009-05-21
Information query
IPC分类: