Invention Grant
US07939889B2 Reducing resistance in source and drain regions of FinFETs 有权
降低FinFET源极和漏极区域的电阻

Reducing resistance in source and drain regions of FinFETs
Abstract:
A semiconductor structure includes a semiconductor fin on a top surface of a substrate, wherein the semiconductor fin includes a middle section having a first width; and a first and a second end section connected to opposite ends of the middle section, wherein the first and the second end sections each comprises at least a top portion having a second width greater than the first width. The semiconductor structure further includes a gate dielectric layer on a top surface and sidewalls of the middle section of the semiconductor fin; and a gate electrode on the gate dielectric layer.
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