Invention Grant
- Patent Title: System and method for detecting gas leaks
- Patent Title (中): 气体泄漏检测系统及方法
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Application No.: US12324649Application Date: 2008-11-26
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Publication No.: US07939804B2Publication Date: 2011-05-10
- Inventor: Roger Schmidt
- Applicant: Roger Schmidt
- Applicant Address: US WA Everett
- Assignee: Fluke Corporation
- Current Assignee: Fluke Corporation
- Current Assignee Address: US WA Everett
- Agency: Perkins Coie LLP
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A gas detection system is disclosed that uses an infrared illumination source and an infrared imaging detector. The infrared source is selected to emit at wavelengths corresponding to an absorption band of a gas to be detected. The region to be analyzed for the gas is illuminated, and the infrared radiation reflects off of local surfaces back to the imaging detector. At locations where the gas is present, the infrared radiation is absorbed which reduces the back reflection to the detector.
Public/Granted literature
- US20100127173A1 SYSTEM AND METHOD FOR DETECTING GAS LEAKS Public/Granted day:2010-05-27
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